Application of characteristic X-rays to measure linear attenuation coefficient of nano-composites used in shielding

Using of X-rays in different industries and especially in medical application is increasing. In this regard, designing of light and efficient protective material based on polymeric nanocomposites and precise study of the effect of adding nanoparticles with different sizes on the X-ray attenuation is necessary. In this study the epoxy nanocomposites with different percentages of copper oxide nanoparticles (5 &10wt%) are produced and the effect of various parameters such as X-rays energy and thickness of the samples on X-ray attenuation was studied. For this purpose, nanocomposite samples were exposed to characteristic X-rays of 25.27 keV and 28.43 keV caused by tin and the linear attenuation coefficient of samples were measured using HPGe semiconductor spectrometer. The distribution of nanoparticles in epoxy was examined using scanning electron microscope. The results of X-ray test demonstrated a significant difference in the X-rays attenuation ability of epoxy by adding nanoparticles. The microscopic images showed proper distribution of nanoparticles in epoxy matrix even in higher percentage.